Atomic Force Microscope Laboratory
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|Facility_Head=Dr. Jenei Attila | |Facility_Head=Dr. Jenei Attila | ||
| + | |Pricelist=Fluorescence Correlation Spectroscope with Confocal Microscope Molecular Cell Analysis Core Facility Atomic Force Microscope Laboratory Pricelist | ||
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Atomic Force Microscope developed for cell biological applications in a collaboration with Applied Optics Group, University Twente, The Netherlands. The AFM can be used also in tapping mode using an oscillating cantilever. The Si3N4 needle is connected a cantilever with a typical spring constant of 0.06 N/m. Scanning is possible at various areas; the maximum is 20 x 20 um. The images normally contain 500 x 500 pixels. For data analysis Plotline a special image analysis program is available. | Atomic Force Microscope developed for cell biological applications in a collaboration with Applied Optics Group, University Twente, The Netherlands. The AFM can be used also in tapping mode using an oscillating cantilever. The Si3N4 needle is connected a cantilever with a typical spring constant of 0.06 N/m. Scanning is possible at various areas; the maximum is 20 x 20 um. The images normally contain 500 x 500 pixels. For data analysis Plotline a special image analysis program is available. | ||
Revision as of 19:18, 15 July 2012
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Location Details |
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Contents |
UD MHSC DBCB AFMLab
[website::http://biophys.med.unideb.hu/hu/node/546]
Address
Atomic Force Microscopy Laboratory
University of Debrecen
Nagyerdei krt. 98.
4029
Debrecen
Dr. Jenei Attila
Head of Group
Dr. Attila Jenei
Position:
Jenei@med.unideb.hu
Office: +36 (52) 412-623
Equipment
| Count | Description | |
|---|---|---|
| Atomic Force Microscope (AFM) | 1 | Atomic Force Microscope |
Group Members
| JENEI, Attila Dr. | Jenei@med.unideb.hu | +36 (52) 412-623 |
| MÁTYUS, László Prof. Dr. | Lmatyus@med.unideb.hu | +36 (52) 412623 , +36-30-229-5890 |
Details
Price List
About the facility
Atomic Force Microscope developed for cell biological applications in a collaboration with Applied Optics Group, University Twente, The Netherlands. The AFM can be used also in tapping mode using an oscillating cantilever. The Si3N4 needle is connected a cantilever with a typical spring constant of 0.06 N/m. Scanning is possible at various areas; the maximum is 20 x 20 um. The images normally contain 500 x 500 pixels. For data analysis Plotline a special image analysis program is available.
